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INTRODUCTION TO ELECTRON MICROSCOPY
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ELECTRON OPTICS
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X-RAY MICROSCOPY
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EFFECTIVE SYSTEMS INTEGRATION AND OPTICAL DESIGN
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PROPERTIES OF MATTER
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TEMPERATURE MEASUREMENT
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ADVANCES IN HEAT TRANSFER
— J. P. HARTNETT & T. F. IRVINE, JR., [EDITORS]
索 书 号 :53.8114083/2/8
出版信息:ACADEMIC 1972 New York
外文图书
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LOW TEMPERATURE PHYSICS
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CRITICAL PHENOMENA IN ALLOYS, MAGNETS & SUPERCONDUCTORS
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QUANTUM THEORY OF SOLIDS
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